| Title | Quantitative analysis of interstitial Mg in Mg2Si studied by single crystal X-ray diffraction |
| Publication Type | Conference Paper |
| Year of Publication | 2013 |
| Authors | Kubouchi M, et. al. |
| Conference Name | Proceedings on the 32rd International Conference on Thermoelectrics, ICT2013 |
| Conference Start Date | 30/06/2013 |
| Publisher | Journal of Electronic Materials |
| Conference Location | Kobe, Japan |
| Keywords | [Portopia Award] |
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