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A7: Developments in measurement techniques and preparation methods

Combustion synthesis applied to compound thermoelectric semiconductors: a new criterion for applicability of combustion processing

Xinfeng Tang1,Xianli Su1, Fan Fu1, Yonggao Yan1,  and Ctirad Uher2

Pulse Transient Hot Strip Technique Adapted for Slab Sample Geometry to Study Anisotropic Thermal Transport Properties of µm-Thin Films

Y. Ma1, J. S. Gustavsson2, Å. Haglund2, M. Gustavsson1 and S. E. Gustafsson3

Thermal Properties Measurements of Bulk Thermoelectric Materials Using Laser Flash Technique

C. C. Yeh and H. Y. Ko

Thermoelectric properties of p-type Bi2Sr2Co2Ox bulks prepared by a partial melting method followed by a hot pressing process

Emmanuel Combe1, Ryoji Funahashi1, Feridoon Azough2, Tristan Barbier1, Robert Freer2

Detailed uncertainty analysis of the ZEM-3 measurement system

J. Mackey1, A. Sehirlioglu2, F. Dynys3

Development of power generating efficiency evaluation instrument in thermoelectric module

Satoaki Ikeuchi, Junichi Ishikawa, Kenji Shimada

Measurements of In-Plane Thermal Diffusivitiesof Layered Organic Semiconductors by ac-Calorimetry

Yulong Yao, Hao Zhang and Joseph W. Brill

Parasitic Thermal Effects in Harman Method for Bulk Materials

Beomjin Kwon, Seung-Hyub Baek, Seong Keun Kim and Jin-Sang Kim

Preparation of thermoelectric nanoparticles using ultrasonic milling

L M Garcia1, We Liu1,2, J J Bomphrey1, D J Javis3 and Gao Min1

Seebeck Coefficient Metrology: Do Contemporary Protocols Measure Up?

Joshua Martin, Winnie Wong-Ng and Martin L. Green

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